Abstract
Perpendicularly magnetized flat thin films of antiperovskite Mn67Ga24N9 were grown on an MgO(001) substrate by reactive sputtering using an argon/1% nitrogen gas mixture and a Mn70Ga30 target. The films showed a saturation magnetization of 80 –100 kA/m, an effective perpendicular magnetic anisotropy (PMA) energy of 0.1–0.2 MJ/m3, and a Curie temperature of 660–740 K. Upon increasing the N composition, the films transformed from ferromagnetic to antiferromagnetic as expected in the stoichiometric Mn3GaN phase. Point contact Andreev reflection spectroscopy revealed that the ferromagnetic MnGaN has a current spin polarization of 57%, which is comparable to D022-MnGa. These findings suggest that MnGaN is a promising PMA layer for future spintronics devices.
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