Abstract
The magnetic properties of Pb(Zr0.5Ti0.5)O3∕La0.9Sr0.1MnO3 bilayers epitaxially grown on Nb-doped SrTiO3 (001) substrate were studied. Bilayers with a fixed Pb(Zr0.5Ti0.5)O3 (PZT) layer thickness of 200nm and different La1−xSrxMnO3 layer thicknesses varying from 10to40nm show a divergence between field-cooled (FC) and zero-field-cooled (ZFC) temperature-dependent magnetization measurements. Moreover, the polarization state of the PZT ferroelectric layer induces a spin-pinning effect causing a variation of the M∕M(10K) ratio in ZFC measurement and the divergent temperature (Td) between FC and ZFC processes. The magnetic hysteresis loops measured in FC and ZFC processes confirm the spin-pinning effect induced from the ferroelectric polarization field, leading to an alternation of the hysteresis loop characteristics for samples polarized with different signs of voltage.
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