Abstract
Bismuth titanate Bi4-xNdxTi3O12 (x = 0, 0.25, 0.45, 0.65, 0.85) samples were prepared using the solid-state reaction route and their dielectric properties were investigated. Crystal structure was analyzed by X-ray diffraction instrument, which indicated that Bi4-xNdxTi3O12 ceramics were pure phases and no other phases appeared. The split peaks around 47.5° for orthorhombic symmetry were gradually combined into a single peak for pseudo-cubic structure with neodymium concentration increasing. Scanning electron microscope (SEM) showed the platelike shapes of the samples, which were related to the layered perovskite structure of bismuth titanate. Dielectric properties were measured with an impedance analyzer LCR (HP 4284A). The dielectric constant peak shifted to a higher temperature and depressed with increasing frequency, which was of significance for their application to electronic functional devices such as high temperature sensors.
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