Abstract
Si Schottky diodes promise to provide cheap, reliable, and linear detectors for use in femtosecond and picosecond pulse width measurement. At low pulse excitation density (<100 pJ/cm 2), the pulse width can be deduced from the first-order autocorrelation, and the measured results are in agreement with the theoretical ones. When pulse excitation density is larger than 1 nJ/cm 2, the pulse trailing edge is distorted due to bandgap reduction in semiconductor Si and the pulse width cannot be measured accurately by means of the first-order autocorrelation. The interference fringes presented in the first-order autocorrelation measurement can provide a way of calibrating the delay, and the pulse width can also be obtained by calculating the number of interference fringes.
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