Abstract
The technique for interpreting magneto-ellipsometric measurements is proposed. The model of a homogeneous semi-infinite medium for reflecting layered magnetic structures in the presence of the magnetic field in the configuration of the magneto-optical equatorial Kerr effect is considered. Based on the analysis of the Fresnel coefficients with regard to the magneto-optical parameter Q appearing in the off-diagonal elements of the permittivity tensor, the expressions are obtained using which the refraction (n) and absorption (k) coefficients, the real (Q1) and imaginary (Q2) parts of the magneto-optical parameter can be found from the ellipsometric (ψ0 and Δ0) and magneto-ellipsometric (ψ0 + δψ and Δ0 + δΔ) measurements. The results will allow to measure and analyze the magnetic characteristics such as hysteresis loops and the coercitive force of layered nanostructures using the conventional ellipsometric equipment.
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