Abstract
Physical Unclonable Function (PUF) has broad application prospects in the field of hardware security. If faults happen in PUF during manufacturing, the security of whole chip will be threatened. Fault diagnosis plays an important role in the yield learning process. However, since different manufactured PUFs with the same design have different Challenge-Response Pairs (CRPs), which cannot be predicted, the traditional fault diagnosis method based on comparing the fault-free responses of a design and the failing responses of chips is no longer suitable for diagnosing PUF. Therefore, this paper proposes a fault diagnosis method toward classic arbiter PUF. The stuck-at faults and the delay faults are considered. Based on the expected uniformity of arbiter PUF, a diagnostic challenge generation method and a corresponding CRP analysis method are proposed to distinguish faults within the arbiter PUF. Experimental results show that the diagnostic accuracy achieves 100.0% with good diagnostic resolution.
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