Abstract
Test coverage information is usually used to compute the suspiciousness to locate the software errors in the current fault localization techniques, but this technique usually do not consider the reliance information within the target program, and the precision is also very low. A novel fault localization technique based on fine grained slicing spectrum is proposed in this paper, which can increase the efficiency of fault localization. This technique analyzes the reliance information under fine grained level, and selects the check points which are prone to be faulty, and the faulty statements is located according to the suspicious result. Experimental results show that this technique has better efficiency than the current techniques.
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