Abstract
Structured illumination microscopy (SIM) is a powerful technique for providing super-resolution imaging, but its reconstruction algorithm, i.e., linear reconstruction structured illumination microscopy (LRSIM) algorithm in the Fourier domain, limits the imaging speed due to its computational effort. Here, we present a novel reconstruction algorithm that can directly process SIM data in the spatial domain. Compared to LRSIM, this approach uses the same number of frames to achieve a comparable resolution but with a much faster processing speed. Our algorithm was verified on both simulated and experimental data using sinusoidal pattern illumination. Moreover, this algorithm is also applicable for speckle pattern illumination.
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