Abstract
Digital holographic microscopy is a high-precision, high-resolution quantitative detection method, however, aberration compensation significantly increases the data processing time. We herein propose a method based on sequential shift and a differential–integral algorithm to compensate for fast phase aberrations. The proposed method obtains the phase derivative of the real sample phase information through holograms at different positions and then reconstructs the aberration-free phase result through integration. The compensation avoids complex phase polynomial fitting calculations or optimization iterations, achieves extremely fast aberration compensation, and can theoretically eliminate various low and high-order aberrations, including extremely complex aberrations. We experimentally validate the effectiveness and high speed of the proposed method by imaging paramecium samples.
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