Abstract
V K-edge EXAFS studies of V2O5/SiO2 catalysts prepared by a chemical vapour deposition (CVD) method demonstrate the formation of V2O5 thin films, while the V2O5 of V2O5/SiO2 prepared by an impregnation method is mainly in the form of microcrystallites.
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More From: Journal of the Chemical Society, Faraday Transactions
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