Abstract
Abstract Sol-gel thin films of La2Ti2O17 were deposited on fused silica and Si( 100) substrates by a spin-coating process. The La2Ti2O17 precursor solution for the spin-coating was prepared from lanthanum acetylacetonate and titanium iso-propoxide dissolved in 2-methoxyethanol. Crystalline and crack-free films of ∼ 0.3 μm thickness were deposited on the above sulastrates using a single coating and followed by annealing at a temperature of 800 "C. Microstructural studies revealed that these films contained extremely fine grains of ∼ 0.1 μm. Thin film X-ray diffraction patterns indicated the formation of grain oriented films along [100] direction on these substrates.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
