Extreme Value Theory Applications to Space Radiation Damage Assessment in Satellite Microelectronics.

Abstract

Calculations of the first and second moments of displacement damage energy distributions from clastic collisions and from nuclear reactions, at proton energies ranging from 10 MeV to 300 MeV, are incorporated into a model describing the probability of damage as a function of the proton fluence and the size of the sensitive micro-volume in Si. Comparisons between the predicted and measured leakage currents in Si imaging arrays illustrate how the Poisson distribution of higher energy nuclear reaction recoils affects the pixel-to-pixel variance in the damage across the array for proton exposures equivalent to mission duration of a few years within the earth's trapped proton belts. Extreme value statistics (EVS) quantify the largest expected damage extremes following a given proton fluence, and an analysis derived from the first-principle damage calculations shows excellent agreement with the measured extremes. EVS is also used to demonstrate the presence of high dark current pixels, or "spikes," which occur from different mechanisms. Different sources of spikes were seen in two different imager designs.