Abstract
Potential step and in situ atomic force microscopy measurements were employed to study the nucleation and subsequent behaviour of a silver single nucleus on carbon microelectrodes. It was shown that the preceding electrodeposition process on the carbon microelectrode strongly affects the subsequent nucleation and growth behaviour. A method of destroying or avoiding this historic effect of the substrate was developed. It provides a new way of performing a large number of electrochemical measurements without mechanical polishing and manual interference, and therefore facilitates further more detailed studies of a system which requires continuous and automatic I-t transient measurements of statistical meaning. It was demonstrated that secure and automatic statistical measurements of I-t transients could be fulfilled utilising the method.
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