Abstract
A method for directly extracting the coupling coefficients, the resonant frequency detunings and the loss of an N(th)-order serially-coupled microring resonator filter from the measured power spectral responses is presented. The device parameters are obtained from the through-port complex transfer function, which is constructed from the experimentally extracted poles and zeros of the filter. We applied the method to determine the parameters of a symmetric microring doublet fabricated in the Silicon-on- Insulator material platform. Simulated spectral responses using the extracted parameters showed good agreement with the measured data. The extracted parameters along with the poles and zeros of the device provide important information about the fabrication process and can be used to guide the post-fabrication trimming of high-order microring filters.
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