Abstract

We report recent progress in the construction of a new aberration-corrected photoemission electron microscope. The correction element in this instrument is a hyperbolic electron mirror, correcting for chromatic and spherical aberration. We present results from a numerical simulation combining a trajectory and wave-optical analysis, and we discuss the calculation of the modulation transfer function in this approach. First images on nano-structured metal and semiconductor surfaces have been obtained with the new instrument and are also presented.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.