Abstract

In this article we will report on Kossel experiments by means of synchrotron radiation. To our knowledge this is the first demonstration that Kossel patterns can be observed using fluorescent radiation excited by synchrotron X-rays. Kossel patterns are characterized by the importance of a high degree of information in the determination of the crystal structure, e.g. the orientation matrix, lattice parameter, symmetry elements and the phase of scattering waves into the microstructure of the single crystal under consideration. In the first test experiment Cu and GaAs single crystals were investigated.

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