Abstract
The exchange bias phenomenon in bilayered and trilayered thin films, based on NiFe and IrMn, was studied. The exchange bias and coercivity fields dependences on the antiferromagnetic layer thickness were obtained. It was shown that 6 nm of IrMn is a critical thickness for the exchange bias appearance. Largest value of the exchange bias is found to be for NiFe/IrMn/NiFe sample with 10nm thickness of antiferromagnetic layer.
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