Abstract
Scanning tunneling microscopy (STM) has been used to investigate rough Au:Pd thin films. The Au:Pd surface is best described by the self-affine scaling model, with the roughness exponent α=0.79±0.06 and the interface width w=15.0±0.5 Å measured directly from the STM images. We further show how α and w may be extracted from diffraction techniques by utilizing the multilevel diffraction theory, using the STM images as a model self-affine surface.
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