Abstract
X-ray specular-reflectivity measurements have been carried out on Ag75Co25 granular films which were sputter-deposited on Si substrates with SiO2 surface, to investigate the evolution of surface roughness as a function of film thickness. X-ray reflectivity data were recorded for thicknesses of Ag75Co25 thin films ranging from 8.8-116.9 nm. A power law behaviour of the interfacial width of a growing interface in sputtered-deposited Ag75Co25 granular films was observed. The scaling exponent was found to be β = 0.43±0.01 and compared with theoretical calculations. High resolution electron microscopy revealed the presence of crystalline particles of fcc Ag and hcp Co. The structural and magnetoresistive properties of the films are discussed.
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