Abstract
AbstractThe dynamical theory of X‐ray diffraction by imperfect crystals with randomly distributed microdefects, applicable to double‐crystal diffractometry (DCD), has been extended to account for the simultaneous presence of several types of microdefects. The obtained formulae for coherent and diffuse components of the rocking curve (RC) have been applied to the quantitative characterization of the complex microdefect structure in silicon samples annealed at 750 °C for various time intervals by using high‐resolution double‐crystal X‐ray diffraction measurements. Time dependencies of concentrations and average sizes of oxygen precipitates and dislocation loops have been determined by using characterization results. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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