Abstract
Combined in situ scanning probe microscopy with transmission electron microscope (TEM) has been used to study the field-induced migration of oxygen vacancies in the thin films of Pr0.7Ca0.3MnO3. Local structural stripes which are associated with the existing oxygen vacancies in the material have been imaged in situ in real time with TEM and are found to migrate under external electric field. The stripes can also be induced by an electric field and relax as the field is dismissed. The characteristic decay time of field-induced stripes are found to be in the similar order of magnitude as the measured resistance relaxation time in the materials. These results confirm microscopically that oxygen migration plays a key role in the bipolar resistance switching behaviors in this class of oxide materials.
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