Abstract

Previous investigations of the low-energy (0-40 eV) electron spectra of Ti and V nitrides have been extended to ZrN. The lowenergy spectra of ZrN films prepared by nitrogen ion implantation contain the corresponding features to those previously observed for TiN and VN. However, the ZrN spectrum is dominated by an extremely large feature at about 3 eV, which has not been previously reported. The amplitude of this peak varies directly with the nitrogen concentration. The peak shape and intensity are sensitive to primary electron beam energy in the range 0.5 to 2.0 keV, but the peak position does not change. The strong dependence of the amplitude of this feature on physisorption of gases and crystallographic orientation suggest that this peak arises from structure in the secondary electron spectrum induced by a surface resonance.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.