Abstract
Abstract The crystal structure and molecular orientation of lead phthalocyanine (PbPc) thin films onto a silicon (Si) and potassium bromide (KBr) were in-situ observed by using the new system combined a total reflection X-ray diffraction (TRXD) with an organic molecular beam deposition (OMBD). When the substrate was kept at a temperature of 25°C, the deposited films consisted of monoclinic crystals and the PbPc molecules tend to orient with the column axis parallel to the surface. Further, the films deposited on Si at 100°C consisted of the triclinic crystals with the column axis parallel to the surface. While, the thin films on KBr exhibited much higher crystallinity than on Si, and same structures even if the substrate temperature of 180°C was raised after deposition.
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