Abstract
This paper investigates the impact of power gating structure on power supply noise using 65nm test chip measurement and simulation. We focus on the body connection of power-gated circuits, and examine the contribution of a power-gated circuit as a decoupling capacitance during the sleep mode. Experimental results show that the well junction capacitance of the power-gated circuit with body-tied structure helps reduce power supply noise while a sharp drop cannot be mitigated due to its large RC time constant.
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