Abstract
An automatic optical inspection system to evaluate functional defects of sub-pixel elements in image displays is proposed, which is based on a single full-field imaging sensor. In order to circumvent sampling aliasing, the display is addressed with a set of grid patterns whose defocused optical images imitate a lower resolution display. The cross-talk between the sensor and the display primary colors is corrected by means of a linear transformation between their color-spaces. Dark and bright dots are located and quantified by applying a notch multi-band Fourier filter to the sensor images. The technique is simple, robust, and easily scalable, since only one image sensor is required, no moving parts are used, and the sensor can be reused to analyze increasing resolution displays.
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