Abstract
Laser scattering from the thin film surface develops self-interference speckle images, which are treated by image processing. As a result, circular fringes are formed due to the phase differences of the two laser beams overlapping after the beams splitter in the Michelson interferometer. The speckle images are captured in double stages of the sample under test, one without loading and the other with loading. Subtracting speckle images provides the similarity of Young's fringes due to the common portions of the two images. Thus the carrier frequency is negated, and posterior spatial filtering contributes only to non-common parts such as fringes. This method shows the simple experimental setup with sufficient accuracy of fringe computation for the estimation of TiO2 thin film.
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