Abstract
A long-term degradation test on amorphous silicon (a-Si) solar cells was performed under various light intensity and temperature conditions. We derived a basic equation for estimating the degradation of conversion efficiency and clarified the dependence of the level of degradation on these parameters. A unique phenomenon in which degradation was suppressed with increasing temperature was observed, and negative activation energies were obtained. The degraded characteristics of the solar cells recovered upon thermal annealing and the recovery characteristics were approximately using a stretched exponential function. The mechanisms by which degradation and recovery advance simultaneously with time are discussed.
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