Estimation of Far End Crosstalk and Near End Crosstalk Noise with Mutually Coupled RLC Interconnect Models

Abstract

The rapid advances in Very Large Scale Integration (VLSI) technology has resulted in the reduction of minimum feature size to sub-quarter microns and switching time in terms of Pico seconds or even less. As a result, the degradation of highspeed digital circuits due to signal integrity issues such as coupling effects, clock feed through, crosstalk noise and delay uncertainty noise. Crosstalk noise in VLSI interconnects is the most effectively considered in Deep Sub Micron (DSM) and Ultra Deep Sub Micron (UDSM) technology and Reduction of crosstalk noise in VLSI interconnect has become more important for highspeed digital circuits. In this paper estimated the Far End Crosstalk(FEXT) and Near End Crosstalk (NEXT) noise of mutually connected RLC interconnect models with simulations results in Advanced Design System(ADS). And also investigated the crosstalk reduction of mutually coupled RLC interconnects through shield insertion technique.