Abstract
Some of the requirements for obtaining reliable compositional images with high resolution energy filtered electron microscopy (EFEM) were tested through EFEM of negatively stained (with uranyl acetate) catalase crystals. We present energy filtered inelastic images of the catalase crystals showing the distribution of both uranium (U) and carbon (C) to 3.4 nm resolution, and introduce a more rigorous approach of image analysis of inelastic CTEM images. This approach is intended to eliminate two artifacts commonly encountered by EFEM, i.e. (a) contrast arising from variations in the shape of energy-loss background as a function of position (b) the amplitude contrast modulation at all energies. We have performed EFEM with a spectrometer that is a homogeneous field magnetic sector corrected for second order energy aberrations and is mounted below the projection chamber of a Philips EM (FEG) 400. The energy filtered electron image was converted into a light image by a transmission phosphor screen, detected with a silicon intensifier target(SIT) camera and displayed on a TV monitor.
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