Abstract
The fundamentals of the energy dispersive X-ray diffraction (EDXD) method for materials characterization have been described using the results of non-crystalline oxides. This relatively new method makes it possible to measure the diffraction profiles in the wide wave vector region over 200 nm -1 which is beyond the limit (usually 150 nm -1 ) for conventional angular dispersive X-ray diffraction method. The validity and usefulness of the EDXD method were demonstrated by obtaining the well-resolved radial distribution functions of SiO 2 glass at room temperature, NaAlSi 3 O 8 melt at 1460 K and LiNbO 3 melt at 1550 K.
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