Abstract
For a feasibility study of energy-dispersive residual stress analysis under laboratory conditions, an X-ray diffractometer that has been operated so far in the angle dispersive diffraction mode was equipped with a commercial tungsten tube and an energy-dispersive solid-state germanium detector. Starting from systematic investigations to find the optimum configuration regarding geometrical resolution, measuring time and stability of the applied detector system, different materials were characterized with respect to the near-surface residual stress state. The results achieved with the modified laboratory equipment within reasonable measuring times are in good agreement with synchrotron measurements performed on the same samples. With the example of a shot-peened Al2O3ceramic with a highly non-uniform near-surface residual stress distribution it is furthermore shown that the different size and shape of the diffracting gauge volume used for the laboratory and synchrotron measurements might have a significant influence on the experimentally obtained Laplace-space residual stress depth profiles σ||(τ).
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