Abstract
The anodic oxide film on titanium has been studied by ellipsometry and SEM observation. Ex situ multiple‐angle‐of‐incidence and in situ ellipsometric measurements allow the complex refractive index to be estimated at for the titanium substrate and at for the anodic oxide film at wavelength 546.1 nm. The anodic oxide film thickness increases linearly with potential in a range from −0.55 to 7.5V (RHE) at the rate of 2.8 nm V−1 in phosphate solutions of pH 1.6–12.1, 2.5 nm V−1 in solution, and 2.4 nm V−1 in solution. At potentials more positive than 7.5V, the film breaks down, leading to the formation of a thick oxide film probably due to an increased ionic current through the breakdown sites. The film composition is estimated to be or , which suggests the presence of hydroxyl bridge in its bonding structure.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.