Abstract
X-ray photoelectron spectroscopy (XPS) spectra of elemental chromium (Cr) are presented. The specimen is a polycrystalline solid and was analyzed after argon ion-sputtering to remove surface contamination. The spectra were collected with a Fisons Instruments ESCALab 220i-XL instrument using monochromatized Al Kα x-rays. Spectra include a survey scan and the Cr 2p, 2s, 3p, 3s, and valence band regions. Also included is the Cr L3M3,2M4,5 Auger transition.
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