Abstract
The ultrastructure of human enamel was studied by ion-sputtering combined with scanning electron microscopy and 2000 kV and 100 kV transmission electron microscopy. The enamel prisms were not thinned uniformly but the prism sheath and some portions in the prism head were selectively eroded by the argon-ion beam. The periphery of the prisms was electron-lucent in 2000 kV transmission electron microscopy. However, with 100 kV transmission electron microscopy, crystals separated by 1.5–2 nm spaces were clearly seen. Various Moiré patterns of parallel lines were observed on some crystals and ion-sputtering produced spotted defects on all crystals.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
