Electron Microscopy Characterization of Hybrid Metallic Nanomaterials

Abstract

In order to understand the excellent properties of nanoscale hybridized materials, it is very important to investigate the microstructures and interfaces of these materials at the nanometer scale. In this chapter, we present the basic principles of transmission electron microscopy and its applications to these materials. In addition to high-resolution transmission electron microscopy (HREM) and high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM), analytical electron microscopy, including energy dispersive X-ray spectroscopy (EDS) and electron energyloss spectroscopy (EELS) as well as elemental mapping methods using these spectroscopy techniques will be presented. Also, the electron holographic technique for characterization of magnetic fields of nanohybridized materials will be explained. In addition to electron microscopic observation techniques, recently developed specimen preparation techniques, which are indispensable for obtaining homogeneous and thin films of nanohybridized materials, will be presented. In particular, a focused ion beam (FIB) method will be emphasized. The nanohybridized materials discussed in this chapter include carbon-based core–shell structure, nanocrystalline soft magnetic materials, nanocomposite magnets, and high-T c superconducting oxides. Application data will be provided in order to explain the usefulness of these analytical techniques for characterization of nanohybridized materials.KeywordsScanning Transmission Electron MicroscopyNanocomposite MagnetCobalt NanoparticlesScanning Transmission Electron Microscopy ImageElectron HolographyThese keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.