Abstract
AbstractMany of the artifacts of conventional electron microscopy can be avoided if the unstained polymers are studied by electron holography and atomic force microscopy (AFM). Holograms of thin sections (50–70 nm) of organic block copolymers were recorded, and the corresponding phase images were reconstructed. In this way, typical structures such as lamellae and cylinders could be imaged without any staining. In addition, we successfully recorded holograms and performed Lorentz microscopy of an impact‐modified polystyrene (high‐impact polystyrene). The results were compared with the tapping mode AFM phase images. Electron holography and AFM have been demonstrated as suitable tools to image unstained heterogeneous polymers, leading to the understanding of their structure. © 2005 Wiley Periodicals, Inc. J Appl Polym Sci 96: 1573–1583, 2005
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