Abstract
Changes in transmission electron diffraction patterns were examined during the epitaxial growth of copper and palladium on (111) gold substrates. Bicrystal patterns contain discrete reflections which can be explained by diffraction from uniformly strained deposit and substrate layers or by double diffraction between these two layers. Extra reflections are also observed, which vary markedly in intensity with increasing deposit thickness. It is shown that the extra reflections may be ascribed to periodic arrays of perfect edge misfit dislocations which are observed directly in both Cu/(111)Au and Pd/(111)Au films. The interpretation of these results is discussed and their significance for more general studies of epitaxial growth is briefly considered.
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