Abstract
Normal electromigration phenomenon, that is matter transport in metals subjected to high d.c. current densities, is accompanied by a quite distinct migration of polygonization substructures. This latter phenomenon has been studied in pure aluminium in the 194 to 494° C temperature range using the Berg-Barrett photographic X-ray technique, and interpretation discussed in terms of Seeger and Schottky's theory. Quantitative measurements give an apparent activation energy of 4 kcal mol−1 for the elementary process responsible for substructure displacement.
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