Abstract
Nonvacuum electrodeposition was used to prepare biaxially textured CeO2 and Sm‐doped CeO2 coatings on Ni‐W substrates. The samples were characterized by X‐ray diffraction (including θ/2θ, pole figures, omega scans, and phi scans), atomic force microscopy (AFM), Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Full‐width at half‐maximum values of the ω scan and φ scan of the electrodeposited layers were better than those of the Ni‐W base substrates, indicating improved biaxial texturing of the electrodeposited layers.
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