Abstract
The present work is devoted to evaluate the area of samples of nanocrystalline Boron Doped Diamond grown with different dopant solutions. The samples were characterized by Scanning Electron Microscopy (SEM) and Atomic Force Micrsocopy (AFM) and electrochemically by Differential-capacitance (Mott-Schottky plots) and Cyclic Voltammetry. By SEM was possible detect "cauli flower" morphology and by AFM was possible to quantify the roughness of the samples. We evaluate the dopant level by Raman spectroscopy and by Mott Schottky plots. The electrochemical roughness measured by AFM was compared with the roughness determined Cyclic Voltammetry.
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