Abstract
Many microelectromechanical systems (MEMS) devices possess charged capacitor structures where the suspension system allows relative electrode motion due to internal or external stimuli. When such a device is subjected to external mechanical vibrations present in a harsh operating environment, unwanted movement between the capacitor plates can generate a noise current which is injected into the connected circuitry. This paper analyzes this phenomenon and presents a model for the dynamics of a MEMS device with capacitive plates experiencing relative motion due to external stimuli. A Fourier series expansion of the current is developed to characterize the frequency content of the signal in closed form for a given vibration frequency, and simulation and experimental results are presented.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
