Abstract
Electrical conductivity during the XPS of ∽100 nm thick films of poly(methyl methacrylate) (PMMA) on silicon was induced by heating to above 100°C. Rapid x-ray-induced depolymerization set in at about the same temperature. The electrical conductivity allowed acquisition of high-resolution core line and valence band spectra from s- and i-PMMA, free of differential charging effects. Within a time-scale of ∽25 min the depolymerization did not affect the appearance of the spectra. The presence of methoxy groups at the uppermost surface of the two heated samples was confirmed by angle-dependent XPS, with an indication of a higher surface concentration of such groups for the s-polymer. At ambient temperature the valence band spectra of the two stereoisomers were identical, but when heated to above 100°C a difference of ∽0.15 eV developed in the O 2s binding energies; this is interpreted as being due to preferential crystallization of the s-polymer. Copyright © 1999 John Wiley & Sons, Ltd.
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