Abstract
Electrical conduction in thin (400−1500 Å) single-crystal aluminum films vacuum evaporated on NaCl substrates is explained by a simple model and verified by experimental results. The resistivity of the inter-island boundaries is accounted for by considering the film structure as a metal—insulator matrix and calculating its equivalent resistivity. An unambiguous comparison can then be made with the Fuchs—Sondheimer theory of size-affected conduction in thin metal films only after subtracting off the resistivity contribution due to interisland boundaries.
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