Abstract
Electrical Characterization of Al/Ta2O5/Al Structures Grown by Electron Beam Deposition I.S. Yahiaa,b,∗ and A.A.M. Farag Department of Physics, Center of Excellent for Advanced Materials Research, Faculty of Science, King Khalid University, P.O. Box 9004, Abha, Saudi Arabia Nano-Science&Semiconductor Labs., Physics Department, Faculty of Education, Ain Shams University Roxy, Cairo, Egypt Thin Film Laboratory, Department of Physics, Faculty of Education, Ain Shams University, Roxy, Cairo, Egypt
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.