Electrical and Optical Properties of TPBi and CzSi Films Fabricated by Spin Coating: The Effects of Varying Thickness and Applied Rapid Thermal Annealing

Abstract

Electrical and optical properties depending on effects of varying thickness and applied rapid thermal annealing of TPBi and CzSi films fabricated by spin coating were determined in detail and the results of these effects were analyzed and discussed. While TPBi film with the highest electrical conductivity in the 3.54-3.56 eV is 0.714 mm thick film (4.13x1012 Siemens at 3.55 eV energy), the film with the lowest electrical conductivity is 0.702 mm thick (1.72x1012 Siemens at 3.55 eV energy). It was found that the refractive index values of TPBi film increased with increasing thickness in region between 356 nm-374 nm. It was observed that when the thickness of TPBi film was increased from 0.702 mm to 0.703 mm, optical band gap of the film did not change, when it was increased to 0.706 mm, the optical band gap energy increased from 3.48 eV to 3.52 eV. As for the rapid annealing effects; basic physical properties of CzSi film depending on various annealed temperatures have been investigated in detail, just like thickness effects. In summary, different thicknesses and rapid thermal effects on noteworthy physical properties of films such as optical electrical conductivity, absorption band edge energy, refractive index, optical band gap energy have been studied and discussed in detail.