Abstract
A semi-graphical method is described with which the optical constants of thin metallic films can be obtained from transmission measurements with parallel and perpendicular polarized light. The equations used in the calculations are those of the classical optics of thin metallic films and were used without further approximations. The method is applied to Cs films of thicknesses 14–160 nm and for photon energies between 1.5 and 3.8 eV.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
