Abstract
Batch manufacturing processes have been widely used in various manufacturing processes, such as wafer fabrication, IC fabrication, and gridline printing process in the solar battery fabrication. In a batch manufacturing process, products are produced batch-by-batch. Thus, total process variations are generally divided into batch-by-batch variation and within-batch variation. The main purpose of this study is to provide an efficient method for testing the batch-processing process yield. Base on the one-way random effect model, the generalized pivotal quantity is utilized to establish the generalized confidence interval for assessing the process yield index. By simulations, the proposed method shows that its empirical coverage probability is not affected by the batch effect, and is still close the nominal coverage probability as the batch size increases.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: International journal of information and management sciences
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
