Abstract

Particle Induced X-ray Emission (PIXE) is an analytical technique, which provides reliably and accurately quantitative results without the need of standards when the efficiency of the X-ray detection system is calibrated. The ion beam microprobe of the Ion Beam Modification and Analysis Laboratory at the University of North Texas is equipped with a 100mm2 high purity germanium X-ray detector (Canberra GUL0110 Ultra-LEGe). In order to calibrate the efficiency of the detector for standard less PIXE analysis we have measured the X-ray yield of a set of commercially available X-ray fluorescence standards. The set contained elements from low atomic number Z=11 (sodium) to higher atomic numbers to cover the X-ray energy region from 1.25keV to about 20keV where the detector is most efficient. The effective charge was obtained from the proton backscattering yield of a calibrated particle detector.

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