Effects of room temperature aging on two cryogenic temperature sensor models used in aerospace applications

Abstract

Cryogenic temperature sensors used in aerospace applications are typically procured far in advance of the mission launch date. Depending upon the program, the temperature sensors may be stored at room temperature for extended periods as installation and groundbased testing can take years before the actual flight. The effects of long term storage at room temperature are sometimes approximated by the use of accelerated aging at temperatures well above room temperature, but this practice can yield invalid results as the sensing material and/or electrical contacting method can be increasingly unstable with higher temperature exposure. To date, little data are available on the effects of extended room temperature aging on sensors commonly used in aerospace applications. This research examines two such temperature sensors models - the Lake Shore Cryotronics, Inc. model CernoxTM and DT-670-SD temperature sensors. Sample groups of each model type have been maintained for ten years or longer with room temperature storage between calibrations. Over an eighteen year period, the CernoxTM temperature sensors exhibited a stability of better than ±20 mK for T<30 K and better than ±0.1% of temperature for T>30 K. Over a ten year period the model DT-670-SD sensors exhibited a stability of better than ±140 mK for T<25 K and better than ±75 mK for T>25 K.