Abstract
In order to obtain precise information on the important parameters in critical phase transitions, such as the correlation length, critical exponent, etc., the effects of inelastic scattering in diffraction experiments must be fully appreciated. We present a simple model for the angular distribution of inelastically scattered He atoms from ordered surfaces. From studies of diffraction from Ni(001) it is found that the model predicts the correct dependence of the inelastic scattered intensity on the the Debye-Waller factor S·u ) 2 > as well as the angular distribution in the zone. The consequence of the inelastic scattering on the sensitivity of He diffraction to the details of surface disorder is discussed.
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